ARC Technology Solutions

General Description
ARC's family of digital subsystem products provide a modular digital stimulus-response system that is capable of meeting the requirements of a variety of digital test systems and devices. Utilizing the digital subsystem, your devices can be tested in a real-world environment for the most accurate assessment of how your system will behave once it moves into production. The intelligent sequencer capability of a stimulus-response system allows the user's test program to provide real-time digital stimulus and response for the device under test (DUT) thus allowing a realistic test of complex digital devices, boards and subsystems. The powerful vector development environment of the TestCentre™ software provides the user with an intuitive development environment for the creation and translation of complex test program sequences.

Interface
The digital subsystem family is available in either a VXI or LAN based interface. The base 2U LAN unit provides 64-128 channels of I/O with larger units of up 512 channels. VXI versions are also available to provide flexibility in test system packaging.

Real-Time Sequencer
The test state sequencer provides per-clock branch and looping control with a 32 level call stack. Additional conditional capability is available with a 16 level trace sequencer that provides logic analyzer-like triggering and trace capabilities.

Memory
The base model provides 1Mbit vector memory depth per pin, with a planned expansion capability up to 64Mbit per pin. Each pin is backed by 1Mbit of tristate / output / expected / record vector memory, enabling per-cycle stimulus and analysis of the DUT.

I/O Modules
I/O modules are available in both fixed and variable voltage versions. VAR/CMOS/TTL

Specsheet Downloads:

• DS Family
• DS201-1000
• DS204-0100
• DS204-9101